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 AEGIS
SEMICONDUTORES LTDA.
A3L:250DT.XXH
VOLTAGE RATINGS
Part Number VRRM , VR (V) rep. peak reverse voltage TJ = 0 to 125OC A3L:250TD.02H A3L:250TD.04H A3L:250TD.06H A3L:250TD.08H A3L:250TD.10H A3L:250TD.12H A3L:250TD.14H A3L:250TD.16H 200 400 600 800 1000 1200 1400 1600 Max. VRSM , VR (V) Max. nonrep. peak reverse voltage TJ = 25 to 125O C 300 500 700 900 1100 1300 1500 1700
TJ = -40 to 0OC 200 400 600 800 1000 1200 1330 1520
MAXIMUM ALLOWABLE RATINGS
PARAMETER TJ Junction Temperature Tstg Storage Temperature IF(AV) Max. Av. current @ Max. TC VALUE -40 to 125 -40 to 150 250 85 555 7.16 IFSM Max. Peak non-rep. surge current 7.81 kA 8.17 8.9 265 50 Hz half cycle sine wave 60 Hz half cycle sine wave t = 10ms Initial TJ = 125 C, no voltage applied after surge.
O
UNITS
O
NOTES 180 O half sine wave 50 Hz half cycle sine wave 60 Hz half cycle sine wave Initial TJ = 125 C, rated VRRM applied after surge.
O
C C C
O
A
O
IF(RMS) Nom. RMS current
A
289 I t Max. I t capability 302 329 It
2 1/2 2 2
t = 8.3 ms kA s t = 10ms t = 8.3 ms kA s
2 1/2 2
Initial TJ = 125 C, rated VRRM applied after surge.
O
O
Initial TJ = 125 C, no voltage applied after surge.
2
Max. I t
2 1/2
capability
3610
Initial TJ = 125OC, no voltage applied after surge.
2 1/2 1/2 tx .
It
di/dt Max. Non-repetitive rate-ofrise current PGM Max. Peak gate power PG(AV) Max. Av. gate power +IGM Max. Peak gate current -VGM Max. Peak negative gate voltage F Mounting Force
500 10 3 150 2 3(5)
A/ms W W mA V N.m
for time tx = I t * (0.1 < tx < 10ms). O TJ = 125 C, VD = VDRM , ITM = 1600A. Gate pulse: 20V, 20W, 10ms, 0.5ms rise time, Max. repetitive di/dt is aproximately 40% of non-repetitive value. tp < 5 ms tp < 5 ms Upper connectors(Heatsink)
AEGIS
SEMICONDUTORES LTDA.
A3L:250DT.XXH
CHARACTERISTICS
PARAMETER VTM peak on-state voltage VT(TO) Threshold voltage rT Slope resistance IL Latching current IH Holding current td Delay time tq Turn-off time dv/dt Critical rate-of-rise of off-state voltage IRM, IDM Peak reverse and offstate current IGT DC gate current to trigger VGT DC gate voltage to trigger VGD DC gate voltage not to trigger RthJC Thermal resistance, junction-to-case RthCS Thermal resistance, case-to-sink wt Weight Case Style MIN. --------------80 ------50 4 2 ------------TYP. ----------0.7 125 140 --10 --80 --------------MAX. UNITS 1.37 0.89 0.61 200 500 1.5 200 --1000 50 300 150 --2.5 0.3 0.07 0.071 0.075 0.02 mA mA V V V mW mA mA ms ms TEST CONDITIONS C, Initial T J = 25 O 50-60Hz half sine, Ipeak = 785A. TJ = 125 O C Av. power = V T(TO) * IT(AV) +rT * [IT(RMS)]2, 180 Half Sine. Use low values for ITM < p rated IT(AV) TC = 125 C, 12V anode. Gate pulse: 10V, 20 W, 100ms. TC = 25 OC, 12V anode. Initial IT = 15A. TC = 25 O VD = VDRM, 50A resistive load. Gate pulse: 10V, C, 20W, 10ms, 1ms rise time. O TJ = 125 C, ITM = 500A, di/dt = 25A/ms, VR = 50V. dv/dt = 20 V/ms lin. to rated V DRM. Gate: 0V, 100 W. TJ = 125 O Exp. to 100% or lin. Higher dv/dt values C. avaliable. To 80% V DRM, gate open. TJ = 125 OC, Exp. To 67% V DRM, gate open. TJ = 125 O Rated VRRM and VDRM, gate open. C, TC = -40 O C TC = 25 OC TC = -40 C
O O
V/ms
+12V anode-to-cathode. For recommended gate drive see "Gate Characteristics" figure.
TC = 25OC TC = 25 OC, Max. Value which will not trigger with rated VDRM V anode. O C/W DC operation, single side cooled. O C/W 180 sine wave, single side cooled.
O
C/W 120 rectangular wave, single side cooled. C/W Mtg. Surface smooth, flat and greased. Single side cooled. -----
O
--500(18) "Magn-A-Pak"
g(oz.) IR
Maximum Allowable Case Temperature
Maximum Allowable Case Temperature (C) Maximum Allowable Case Temperature (C)
120
120
Maximum Allowable Case Temperature
110
110
100
100
90
30
90
30
80
60 90
80
60
70
120 180
70
90 120
60 0 50 100 150 200 250 300
*Sinusoidal Waveform
60
*Rectangular Waveform
180
DC
350
400
0
50
100
150
200
250
300
350
400
450
500
Average Forward Current (A)
Average Forward Current (A)
Fig. 1 - Current Ratings Characteristics
Fig. 2 - Current Ratings Characteristics
AEGIS
SEMICONDUTORES LTDA.
A3L:250DT.XXH
Maximum Average Forward Power Loss
3500
30
Maximum Average Forward Power Loss
3000
Maximum Average Forward Power Loss (W)
Maximum Average Forward Power Loss (W)
30
3000 2500 2000 1500 1000 500 0 0
*Sinusoidal Waveform
2500
2000
60
60
1500
90
90 120 180
1000
120 180 DC
500
0
*Rectangular Waveform
100
200
300
400
500
600
0
100
200
300
400
500
600
Average Forward Current (A)
Average Forward Current (A)
Fig.3 -Forward Power Loss Characteristics
Fig. 4 - Forward Power Loss Characteristics
Forward Voltage Drop
Transient Thermal Impedance ZthJC
1
Instantaneous Forward Current (A)
1000
Transient Thermal Impedance ZthJC
2 3 4 5
0.1
100
125C
25C
10 0 1
0.01 0.01
0.1
1
10
Instantaneous Forward Voltage (V)
Time (s)
Fig. 5 - Forward Voltage Drop Characteristics
Fig. 6 - Transient Thermal Impedance
AEGIS
SEMICONDUTORES LTDA.
A3L:250DT.XXH
Fig. 7 - Gate Trigger Characteristics
1
~
G1
K1
+
K2 2
G2
-
3
Fig. 8 - Outline Characteristics
Fig. 9 - Circuit Layout


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